EMISSION ELECTRON MICROSCOPY - A REVIEW. PT. 1:BASIC CONCEPTS AND APPLICATIONS IN PHYSICSSCHWARZER RA.1981; MICROSC. ACTA; DEU; DA. 1981-01; VOL. 84; NO 1; PP. 51-86; BIBL. 160 REF.Article

TRIODE AND TETRODE GUNS FOR FIELD EMISSION ELECTRON MICROSCOPESDENIZART M; ROQUES S; SONIER F et al.1981; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1981; VOL. 7; NO 1; PP. 65-80; BIBL. 21 REF.Conference Paper

SCANNING AUGER ELECTRON MICROSCOPY AT 30 NM RESOLUTION.VENABLES JA; JANSSEN AP; HARLAND CJ et al.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 34; NO 3; PP. 495-500; BIBL. 11 REF.Article

A STUDY OF A COADSORBATE SURFACE DIFFUSION (PB ON C/W)MORIN R; DRECHSLER M.1981; SURF. SCI.; NLD; DA. 1981-10; VOL. 111; NO 1; PP. 140-148; BIBL. 17 REF.Article

FIELD-EMISSION MICROSCOPIC STUDY OF CATALYTIC DECOMPOSITION OF METHANOL ON METAL SURFACES. I. TUNGSTENKUBOTA JI; AZUMA K.1980; C.S. FARADAY TRANS. 1; ISSN 0300-9599; GBR; DA. 1980; VOL. 76; NO 3; PP. 588-596; H.T. 2; BIBL. 30 REF.Article

A MEASUREMENT OF THE SURFACE SELF-DIFFUSION OF TANTALUMHOK S; DRECHSLER M.1981; SURF. SCI.; NLD; DA. 1981-06; VOL. 107; NO 2/3; PP. L362-L366; BIBL. 15 REF.Article

PULSED-LASER ATOM-PROBE FIELD-ION MICROSCOPYKELLOGG GL; TSONG TT.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 2; PP. 1184-1193; BIBL. 24 REF.Article

Field emission 2000: proceedings of the 46th International Field Emission Symposium, Pittsburgh, PA, USA, 23-28 July 2000DANOIX, F; SEIDMAN, D. N.Ultramicroscopy. 2001, Vol 89, Num 1-3, issn 0304-3991, 220 p.Conference Proceedings

SPACE-CHARGE-LIMITED BIPOLAR CURRENT FLOW BETWEEN CONCENTRIC SPHERICAL ELECTRODESWHEELER CB.1982; IEE PROC., A; ISSN 0143-702X; GBR; DA. 1982; VOL. 129; NO 6; PART. A; PP. 387-390; BIBL. 18 REF.Article

FEM STUDY OF SILVER LAYERS ADSORBED ON TUNGSTEN. III. SILVER LAYER GROWTH MODES = ETUDE PAR MICROSCOPIE ELECTRONIQUE A EMISSION DE CHAMP DES COUCHES D'ARGENT ADSORBEES SUR DU TUNGSTENE. III. MODES DE CROISSANCE DES COUCHES D'ARGENTCONTESCU C.1981; REV. ROUM. CHIM.; ISSN 0035-3930; ROM; DA. 1981; VOL. 26; NO 3; PP. 355-361; H.T. 4; BIBL. 16 REF.Article

FAVOURABLE GROWTH CONDITIONS OF POTASSIUM EPITAXIAL LAYERS ON TUNGSTEN FEM EMITTERBIERNAT T; BEBEN J; CISZEWSKI A et al.1980; J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1980; VOL. 50; NO 2; PP. 521-526; BIBL. 34 REF.Article

FRESNEL DIFFRACTION IN A COHERENT CONVERGENT ELECTRON BEAMCOWLEY JM; DISKO MM.1980; ULTRAMISCROSCOPY; ISSN 0304-3991; NLD; DA. 1980; VOL. 5; NO 4; PP. 469-477; BIBL. 8 REF.Article

THE EFFECT OF TEMPERATURE ON THE FIELD EMISSION FROM LEAD = EFFET DE LA TEMPERATURE SUR L'EMISSION DE CHAMP DU PLOMBZEBROWSKI J.1980; ACTA PHYS. POL., A; ISSN 0587-4246; POL; DA. 1980; VOL. 57; NO 3; PP. 369-376; BIBL. 24 REF.Article

CHEMISORPTION ON DENSELY PACKED METAL SURFACES: MO, W, RE, AND IRLIU R; EHRLICH G.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 119; NO 2/3; PP. 207-233; BIBL. 34 REF.Article

MIGRATION BEHAVIOR OF SINGLE TUNGSTEN ATOMS AND TUNGSTEN DIATOMIC CLUSTERS ON THE TUNGSTEN (110) PLANE = COMPORTEMENT EN MIGRATION D'ATOMES DE TUNGSTENE ET D'AMAS DIATOMIQUES DE TUNGSTENE SUR LE PLAN (110) DU TUNGSTENETSONG TT; CASANOVA R.1980; PHYS. REV. B; ISSN 0163-1829; USA; DA. 1980; VOL. 22; NO 10; PP. 4632-4649; BIBL. 13 REF.Article

FEM AND FIM STUDY OF THE WORK FUNCTION OF STEPPED METAL SURFACES = ETUDE PAR MICROSCOPIES IONIQUE ET ELECTRONIQUE A EFFET DE CHAMP DU TRAVAIL DE SORTIE DE SURFACES METALLIQUES COMPORTANT DES CRANSKNOR Z.1979; COLLECT. CZECH. CHEM. COMMUNIC.; ISSN 0010-0765; CSK; DA. 1979; VOL. 44; NO 12; PP. 3434-3440; BIBL. 37 REF.Article

MODIFICATION OF A FIELD EMISSION SOURCE SEM FOR QUANTITATIVE X-RAY MICROANALYSIS.VADIMSKY RG.1976; ANAL. LETTERS; U.S.A.; DA. 1976; VOL. 9; NO 6; PP. 521-532; BIBL. 1 REF.Article

CRYSTALLINE CO-ADSORPTION LAYERS INDIUM AND ANTIMONY ON TUNGSTEN FIELD EMITTER TIPSCIZEWSKI A; KOZLOWSKI G; SURMA S et al.1982; J. CRYSTAL GROWTH; ISSN 0022-0248; NLD; DA. 1982; VOL. 57; NO 1; PP. 125-130; BIBL. 19 REF.Article

A FIELD EMISSION STUDY OF CARBON ON TUNGSTENRADON T.1980; ACTA PHYS. POL. A; ISSN 0587-4246; POL; DA. 1980; VOL. 58; NO 4; PP. 377-382; H.T. 3; BIBL. 14 REF.Article

DIRECT OBSERVATION OF FINE STRUCTURE OF MAGNETIC DOMAIN WALLS BY ELECTRON HOLOGRAPHY = OBSERVATION DIRECTE DE LA STRUCTURE FINE DE PAROIS DE DOMAINES MAGNETIQUES PAR HOLOGRAPHIE ELECTRONIQUETONOMURA A; MATSUDA T; ENDO J et al.1980; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1980; VOL. 44; NO 21; PP. 1430-1433; BIBL. 14 REF.Article

POSSIBILITES ACTUELLES D'OBSERVATION AUX MICROSCOPES A EMISSION DE CHAMP = PRESENT OBSERVATION POSSIBILITIES OF FIELD EMISSION MICROSCOPESDRECHSLER M.1979; MET., CORROS. IND.; ISSN 0026-1084; FRA; DA. 1979; VOL. 54; NO 643; PP. 120-127; ABS. ENG; BIBL. 16 REF.Article

FIELD ION MICROSCOPY AND MASS SPECTROSCOPY OF SULFUR COVERED SILVER SURFACES.HAYEK K; FRANK O; SCHMIDT WA et al.1977; BER. BUNSENGESELLSCH. PHYS. CHEM.; DTSCH.; DA. 1977; VOL. 81; NO 3; PP. 262-268; ABS. ALLEM.; BIBL. 14 REF.Article

A method of microtip fabrication based on oxygen induced facetingBRYL, Robert; SZCZEPKOWICZ, Andrzej.Applied surface science. 2005, Vol 241, Num 3-4, pp 431-434, issn 0169-4332, 4 p.Article

High resolution imaging and analysis of grain boundaries in steel using a field emission auger microprobeWALMSLEY, J. C; JONES, G; LEE, B. J et al.Applied surface science. 1997, Vol 108, Num 2, pp 289-295, issn 0169-4332Article

Expected contribution of the field-emission gun to high-resolution transmission electron microscopyZEMLIN, F.Micron (1993). 1994, Vol 25, Num 3, pp 223-226, issn 0968-4328Article